Permutation Entropy as a Parameter of Characterizing the Surface of a Thin Film
1. Permutation Entropy as a Parameter of Characterizing the Surface of a Thin Film

Mohammad Reza Zamani Meymian; Rouhollah Haji Abdolvahab

Volume 4, Issue 2 , March and April 2020, , Pages 152-160

http://dx.doi.org/10.33945/SAMI/CHEMM.2020.2.5

Abstract
  In this work, silver thin films were prepared using sputtering at different deposition times with the nanoscale thickness. To investigate their surface morphology, atomic force microscopy ...  Read More