Chemical Methodologies

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Volume 7 (2023)
Volume 6 (2022)
Volume 5 (2021)
Volume 4 (2020)
Volume 3 (2019)
Volume 2 (2018)
Volume 1 (2017)

Keywords = Atomic Force Microscopy (AFM)

Number of Articles: 2
Characterization of ZnO, Cu and Mo Composite Thin Films in Different Annealing Temperatures
Characterization of ZnO, Cu and Mo Composite Thin Films in Different Annealing Temperatures

Rouhollah Haji Abdolvahab; Mohammad Reza Zamani Meymian; Noura Soudmand

Volume 4, Issue 3 , May and June 2020, , Pages 276-284

https://doi.org/10.33945/SAMI/CHEMM.2020.3.5

Abstract
  In this research study, we prepared different thin films of ZnO:Cu, ZnO:Mo, and Zno:Mo:Cu using a magnetron co-sputtering method. At the best of our knowledge, it is the first time ...  Read More
Permutation Entropy as a Parameter of Characterizing the Surface of a Thin Film
Permutation Entropy as a Parameter of Characterizing the Surface of a Thin Film

Mohammad Reza Zamani Meymian; Rouhollah Haji Abdolvahab

Volume 4, Issue 2 , March and April 2020, , Pages 152-160

https://doi.org/10.33945/SAMI/CHEMM.2020.2.5

Abstract
  In this work, silver thin films were prepared using sputtering at different deposition times with the nanoscale thickness. To investigate their surface morphology, atomic force microscopy ...  Read More